Laung-Terng L. Wang and Irving T. Ho Chair Professors Dr. Kwang-Cheng Chen and Dr. Homer H.
|Published (Last):||2 August 2004|
|PDF File Size:||18.34 Mb|
|ePub File Size:||16.97 Mb|
|Price:||Free* [*Free Regsitration Required]|
This book provides broad and comprehensive coverage of the entire EDA flow. Electronic design and test engineers of today have to deal with these complex and heterogeneous systems digital, mixed-signal, memory , but few have the possibility to study the whole field in a detailed and deep way. This book provides an extremely broad knowledge of the discipline, covering the fundamentals in detail, as well as the most recent and advanced concepts.
The comprehensive review of future test technology trends, including self-repair, soft error protection, MEMS testing, and RF testing, leads students and researchers to advanced DFT research.
Hans-Joachim Wunderlich, University of Stuttgart, Germany Recent advances in semiconductor manufacturing have made design for testability DFT an essential part of nanometer designs. I am pleased to find a DFT textbook of this comprehensiveness that can serve both academic and professional needs.
Andre Ivanov, University of British Columbia, Canada This is the most recent book covering all aspects of digital systems testing. It is a "must read for anyone focused on learning modern test issues, test research, and test practices.
Kewal K. Saluja, University of Wisconsin-Madison By covering the basic DFT theory and methodology on digital, memory, as well as analog and mixed-signal AMS testing, this book stands out as one best reference book that equips practitioners with testable SOC design skills. He received his EE Ph.
VLSI test principles and architectures : design for testability
vlsi test principles and architectures des.pdf